Surface segregation of interstitial manganese in Ga1-x Mnx As studied by hard x-ray photoemission spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 7, 2008, Pages

  Schmid, B ^a   Muller A ^a   Sing, M ^a   Claessen, R ^a   Wenisch, J ^a   Gould, C ^a   Brunner, K ^a   Molenkamp, L ^a   Drube, W ^b  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50449108596     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.075319     Document Type: Article

References (34)

1. G. A. Prinz, Science SCIEAS 0036-8075 10.1126/science.282.5394.1660 282, 1660 (1998).
2. H. Ohno, A. Shen, F. Matsukura, A. Oiwa, A. Endo, S. Katsumoto, and Y. Ide, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.118061 69, 363 (1996).
3. T. Jungwirth, J. Sinova, J. Maek, J. Kuera, and A. H. MacDonald, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.78.809 78, 809 (2006).
4. K. Olejník, M. H. S. Owen, V. Novak, J. Mašek, A. C. Irvine, J. Wunderlich, and T. Jungwirth, arXiv:0802.2080 (unpublished).
5. K. C. Ku, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1564285 82, 2302 (2003).
6. K. W. Edmonds, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92. 037201 92, 037201 (2004).
7. R. C. Myers, B. L. Sheu, A. W. Jackson, A. C. Gossard, P. Schiffer, N. Samarth, and D. D. Awschalom, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74. 155203 74, 155203 (2006).
8. X. Liu, A. Prasad, J. Nishio, E. R. Weber, Z. Liliental-Weber, and W. Walukiewicz, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.114782 67, 279 (1995).
9. T. Dietl, H. Ohno, F. Mastukura, J. Cibert, and D. Ferrand, Science SCIEAS 0036-8075 10.1126/science.287.5455.1019 287, 1019 (2000).
10. M. Adell, J. Kanski, L. Ilver, J. Sadowski, V. Stanciu, and P. Svedlindh, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.94.139701 94, 139701 (2005).
11. F. Kronast, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.235213 74, 235213 (2006).
12. K. M. Yu, W. Walukiewicz, T. Wojtowicz, I. Kuryliszyn, X. Liu, Y. Sasaki, and J. K. Furdyna, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.201303 65, 201303 (R) (2002).
13. K. W. Edmonds, N. R. S. Farley, T. K. Johal, G. van der Laan, R. P. Campion, B. L. Gallagher, and C. T. Foxon, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.064418 71, 064418 (2005).
14. H. Raebiger, M. Ganchenkova, and J. von Boehm, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2219337 89, 012505 (2006).
15. T. Hynninen, M. Ganchenkova, H. Raebiger, and J. von Boehm, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.195337 74, 195337 (2006).
16. G. M. Schott, W. Faschinger, and L. W. Molenkamp, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1403238 79, 1807 (2001).
17. W. Drube, T. M. Grekh, R. Teusch, and G. Materlik, J. Electron Spectrosc. Relat. Phenom. 88-91, 683 (1998). 0368-2048
18. T. A. Carlson and G. E. McGuire, J. Electron Spectrosc. Relat. Phenom. 1, 161 (1973). 0368-2048
19. M. P. Seah, Practical Surface Analysis, 2nd ed. (Wiley, New York, 1990).
20. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. SIANDQ 0142-2421 10.1002/sia.740171305 17, 927 (1991).
21. Z. Liu, Y. Sun, F. Machuca, P. Pianetta, W. E. Spicer, and R. F. W. Pease, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.1532737 21, 212 (2003).
22. M. B. Trzhaskovskaya, V. I. Nefedov, and V. G. Yarzhemsky, At. Data Nucl. Data Tables ADNDAT 0092-640X 10.1006/adnd.2000.0849 77, 97 (2001).
23. H. Wada and Y. Tanabe, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1419048 79, 3302 (2001).
24. The plotted oxide thickness represents an average of the values determined from the As 2p and the Ga 2p spectrum, respectively. It is known that the Ga-derived surface oxide always comes out to be thicker than that of the As oxide, which has been explained by a chemically driven surface segregation of Ga during the oxidation process.
25. J. T. Wolan, W. S. Epling, and G. B. Hoflund, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.364398 81, 6160 (1997).
26. D. A. Allwood, R. T. Carline, N. J. Mason, C. Pickering, B. K. Tanner, and P. J. Walker, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(99)00959- 1 364, 33 (2000).
27. B. J. Kirby, J. A. Borchers, J. J. Rhyne, K. V. O'Donovan, S. G. E. te Velthuis, S. Roy, C. Sanchez-Hanke, T. Wojtowicz, X. Liu, W. L. Lim, M. Dobrowolska, and J. K. Furdyna, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.245304 74, 245304 (2006).
28. J. Okabayashi, A. Kimura, O. Rader, T. Mizokawa, A. Fujimori, T. Hayashi, and M. Tanaka, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.58.R4211 58, R4211 (1998).
29. S.-P. Jeng, R. J. Lad, and V. E. Henrich, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.43.11971 43, 11971 (1991).
30. S. Hatfield, T. Veal, C. McConville, G. Bell, K. Edmonds, R. Campion, C. Foxon, and B. Gallagher, Surf. Sci. 585, 66 (2005). 0039-6028
31. M. Yamada and Y. Ide, Surf. Sci. Lett. SUSCAS 0167-2584 10.1016/0039-6028(95)80057-3 339, L914 (1995).
32. B. Schmid, A. Müller, M. Sing, J. Wenisch, C. Gould, K. Brunner, L. W. Molenkamp, W. Drube, and R. Claessen (unpublished).
33. M. Adell, J. Adell, L. Ilver, J. Kanski, J. Sadowski, and J. Z. Domagala, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.75.054415 75, 054415 (2007).
34. K. W. Edmonds, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.94. 139702 94, 139702 (2005).