Magnetic and chemical nonuniformity in Ga1-x Mnx As films as probed by polarized neutron and x-ray reflectometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 24, 2006, Pages

  Kirby, B J ^a,b   Borchers, J A ^c   Rhyne, J J ^b   O'Donovan, K V ^c,d   Te Velthuis, S G E ^e   Roy, S ^f   Sanchez Hanke, Cecilia ^g   Wojtowicz, T ^h,i   Liu, X ^h   Lim, W L ^h   Dobrowolska, M ^h   Furdyna, J K ^h  

^a UNIVERSITY OF MISSOURI   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e ARGONNE NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF CALIFORNIA   (United States)

^g BROOKHAVEN NATIONAL LABORATORY   (United States)

^h UNIVERSITY OF NOTRE DAME   (United States)

ⁱ INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845458044     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.245304     Document Type: Article

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