Two-dimensional spectral shearing interferometry resolved in time for ultrashort optica] pulse characterization

Journal of the Optical Society of America B: Optical Physics

Volumn 25, Issue 6, 2008, Pages

  Lelek, Mickaël ^a   Louradour, Frédéric ^a   Barthélémy, Alain ^a   Froehly, Claude ^a   Mansourian, Tigran ^b   Mouradian, Levon ^b   Chambaret, Jean Paul ^c   Chériaux, Gilles ^c   Mercier, Brigitte ^c  

^a CNRS   (France)

^b YEREVAN STATE UNIVERSITY   (Armenia)

^c LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC PULSE; INTERFEROMETRY; SHEARING; SIGNAL TO NOISE RATIO; TIME DELAY; ULTRASHORT PULSES;

COHERENT MEASUREMENT; HIGH SIGNAL-TO-NOISE RATIO; INTERFERENCE PATTERNS; PULSE CHARACTERIZATION; SINGLE-SHOT OPERATION; SPECTRAL SHEARING INTERFEROMETRY; TWO DIMENSIONAL (2 D); ULTRASHORT OPTICAL PULSE;

PULSE REPETITION RATE;

EID: 50449100531     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.25.000A17     Document Type: Article

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