Two-dimensional spectral shearing interferometry for few-cycle pulse characterization

Optics Letters

Volumn 31, Issue 13, 2006, Pages 2063-2065

  Birge, Jonathan R ^a   Ell, Richard ^a   Kärtner, Franz X ^a  

^a Massachusetts Institute of Technology ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD RECONSTRUCTION; PHASE SPECTRA; SPECTRAL SHEARING INTERFEROMETRY;

BANDWIDTH; ELECTRIC FIELDS; IMAGE CODING; INTERFEROMETRY; SPECTRUM ANALYSIS;

ULTRASHORT PULSES;

EID: 33746787885     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.31.002063     Document Type: Article

References (13)

1. C. Iaconis and I. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
2. L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).
3. R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
4. C. Dorrer and I. Walmsley, Appl. Phys. B 74, S209 (2002).
5. S. Jensen and M. Anderson, Appl. Opt. 43, 883 (2004).
6. J. Nicholson, J. Jasapara, W. Rudolph, F. Omenetto, and A. Taylor, Opt. Lett. 24, 1774 (1999).
7. D. Kane and R. Trebino, IEEE J. Quantum Electron. 29, 571 (1993).
8. J. Chung and A. Weiner, IEEE J. Sci. Top. Quantum Electron. 7, 656 (2001).
9. B. Seifert, H. Stolz, and M. Tasche, J. Opt. Soc. Am. B 21, 1089 (2004).
10. K. Yamane, Z. Zhang, K. Oka, R. Morita, and M. Yamashita, Opt. Lett. 28, 2258 (2003).
11. P. Baum, S. Lockbrunner, and E. Riedle, Opt. Lett. 29, 210 (2004).
12. E. Kosik, A. Radunksy, I. Walmsley, and C. Dorrer, Opt. Lett. 30, 326 (2005).
13. NanoLayers GmbH, www.nanolayers.de, Venteon UltraBroad.