Time resolved spectral interferometry for single shot femtosecond characterization

Optics Communications

Volumn 261, Issue 1, 2006, Pages 124-129

  Lelek, M ^a   Louradour, F ^a   Barthelemy, A ^a   Froehly, C ^a  

^a Science and Technique Faculty ^*  (France)

Author keywords

Amplitude and phase; Nonlinear optics; Pulse characterization; Shearing interferometry; Ultrafast diagnostic; Ultrafast measurement; Ultrashort pulses

Indexed keywords

GLASS; LASER PULSES; NONLINEAR OPTICS; ULTRAFAST PHENOMENA;

AMPLITUDE; FEMTOSECOND PULSE; GLASS PARALLEL PLATE; PHASE; PULSE CHARACTERIZATION; SHEARING INTERFEROMETRY; SPECTRAL INTERFEROMETRY; SPECTRAL PHASE SHIFT; ULTRAFAST DIAGNOSTIC; ULTRAFAST MEASUREMENT;

ULTRASHORT PULSES;

EID: 33645866752     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.12.002     Document Type: Article

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