Interferometric technique for measuring broadband ultrashort pulses at the sampling limit

Optics Letters

Volumn 30, Issue 3, 2005, Pages 326-328

  Kosik, Ellen M ^a,b   Radunsky, Aleksander S ^a,b   Walmsley, Ian A ^b   Dorrer, Christophe ^c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE DIFFERENCES; SPATIAL INTERFERENCE PATTERNS; SPECTRAL PHASE INTERFEROMETRY; ULTRASHORT OPTICAL PULSES;

ALGORITHMS; BANDWIDTH; BARIUM COMPOUNDS; CRYSTALLINE MATERIALS; DIFFRACTION GRATINGS; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE INTERFERENCE; INTEGRATION; INTERFEROMETRY;

ULTRASHORT PULSES;

EID: 13144252247     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.30.000326     Document Type: Article

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