Precision and consistency criteria in spectral phase interferometry for direct electric-field reconstruction

Journal of the Optical Society of America B: Optical Physics

Volumn 19, Issue 5, 2002, Pages 1030-1038

  Dorrer, Christophe ^a,b   Walmsley, Ian A ^a,c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; INTERFEROMETRY; REDUNDANCY; ULTRASHORT PULSES;

INTERFEROGRAM;

NONLINEAR OPTICS;

EID: 0141454785     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.19.001030     Document Type: Article

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