A neural network approach for fault diagnosis of large-scale analogue circuits

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 2002, Pages 153-156

  He, Yi Gang ^a   Tan, Yang Hong ^a   Sun, Yichuang ^b  

^a HUNAN UNIVERSITY   (China)

^b UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BACKPROPAGATION; COMPUTER SIMULATION; LSI CIRCUITS; NEURAL NETWORKS; ROBUSTNESS (CONTROL SYSTEMS);

BACKWARD ERROR PROPAGATION NETWORK; FAULT DICTIONARY TECHNIQUE; SOFTWARE PACKAGE PSPICE;

INTEGRATED CIRCUIT TESTING;

EID: 0036286696     PISSN: 02714310     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISCAS.2002.1009800     Document Type: Article

References (9)

1. Linear circuit fault diagnosis using neuromorphic analyzers
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3. A neural network approach for identification and fault diagnosis of dynamic systems
4. Hopfield/art-1 neural network-based fault detection and fault diagnosis of dynamic systems
5. Neural networks-based L1-norm optimization approach for fault diagnosis of nonlinear circuits with tolerance
6. Fault isolation in nonlinear analog circuits with tolerances using neural networks
7. Cut-fault diagnosis of nonlinear circuits
8. A topological method of class-fault diagnosis
9. Robust fault diagnosis for large-scale analog circuits with measurement noises