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Volumn 5, Issue , 2003, Pages

Class-based neural network method for fault location of large-scale analogue circuits

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT LOCATION; LSI CIRCUITS; REAL TIME SYSTEMS;

EID: 0037743757     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (13)
  • 1
    • 0022107260 scopus 로고
    • Fault diagnosis of analog circuits
    • J. W. Bandler and A. E. Salama, "Fault diagnosis of analog circuits," Proceedings of IEEE, Vol.73, No.8, pp. 1279-1325, 1985.
    • (1985) Proceedings of IEEE , vol.73 , Issue.8 , pp. 1279-1325
    • Bandler, J.W.1    Salama, A.E.2
  • 4
    • 0038072274 scopus 로고
    • Investigation on diagnosis of the faulty branch-set class
    • Y. Sun, "Investigation on diagnosis of the faulty branch-set class," Journal of China Institute of Communications, Vol. 13, No.3, 1992.
    • (1992) Journal of China Institute of Communications , vol.13 , Issue.3
    • Sun, Y.1
  • 6
    • 0031094371 scopus 로고    scopus 로고
    • Linear circuit fault diagnosis using neuromorphic analyzers
    • R. Spain and S. Upadhyaya, "Linear circuit fault diagnosis using neuromorphic analyzers", IEEE Trans. CAS-II. Vol.44, No.3, pp. 188-196, 1997.
    • (1997) IEEE Trans. CAS-II , vol.44 , Issue.3 , pp. 188-196
    • Spain, R.1    Upadhyaya, S.2
  • 8
    • 0028749571 scopus 로고
    • A neural network approach for identification and fault diagnosis of dynamic systems
    • A. Bernieri, M.D'Apuzzo, L. Somsone, etc, "A neural network approach for identification and fault diagnosis of dynamic systems", IEEE Trans. IM, Vol.43, No.6, 1994.
    • (1994) IEEE Trans. IM , vol.43 , Issue.6
    • Bernieri, A.1    D'Apuzzo, M.2    Somsone, L.3
  • 9
    • 0028542818 scopus 로고
    • Hopfield/Art-1 neural network-based fault detection and fault diagnosis of dynamic systems
    • A. Srinivasan and C. Batur, "Hopfield/Art-1 neural network-based fault detection and fault diagnosis of dynamic systems", IEEE Trans. Neural Networks, Vol.5, No.6, pp.890-899, 1994.
    • (1994) IEEE Trans. Neural Networks , vol.5 , Issue.6 , pp. 890-899
    • Srinivasan, A.1    Batur, C.2
  • 10
    • 0035417866 scopus 로고    scopus 로고
    • Neural networks-based L1-norm optimization approach for fault diagnosis of nonlinear circuits with tolerance
    • August
    • Y. He and Y. Sun, "Neural networks-based L1-norm optimization approach for fault diagnosis of nonlinear circuits with tolerance," IEE Proceedings: Circuits, Devices and Systems, Vol. 148, No.4, pp.223-228, August 2001.
    • (2001) IEE Proceedings: Circuits, Devices and Systems , vol.148 , Issue.4 , pp. 223-228
    • He, Y.1    Sun, Y.2
  • 11
    • 0038748768 scopus 로고    scopus 로고
    • Fault isolation in nonlinear analog circuits with tolerances using neural networks
    • Sydney
    • Y. He and Y. Sun, "Fault isolation in nonlinear analog circuits with tolerances using neural networks," Proc. IEEE Int. Symp. Circuits and Systems, pp.854-857, Sydney, 2001.
    • (2001) Proc. IEEE Int. Symp. Circuits and Systems , pp. 854-857
    • He, Y.1    Sun, Y.2
  • 12
    • 0009600350 scopus 로고    scopus 로고
    • Fault diagnosis of analog circuits with tolerances using artificial neural networks
    • Tianjin, China
    • Y. He, Y. Ding and Y. Sun, "Fault diagnosis of analog circuits with tolerances using artificial neural networks," Proc. IEEE APCCAS, pp.292-295, Tianjin, China, 2000.
    • (2000) Proc. IEEE APCCAS , pp. 292-295
    • He, Y.1    Ding, Y.2    Sun, Y.3
  • 13
    • 0036286696 scopus 로고    scopus 로고
    • A neural network approach for fault diagnosis of large-scale analog circuits
    • Arizona, USA
    • Y. He, Y. Tan and Y. Sun, "A neural network approach for fault diagnosis of large-scale analog circuits", Proc. IEEE ISCAS, pp. 153-156, Arizona, USA, 2002.
    • (2002) Proc. IEEE ISCAS , pp. 153-156
    • He, Y.1    Tan, Y.2    Sun, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.