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Volumn , Issue , 2008, Pages 78-81

Oxidation of high area ratio silicon microchannels fabricated by electrochemical etching

Author keywords

HF concentration; High aspect ratio; Microchannel; Oxidation

Indexed keywords

CHEMICAL OXYGEN DEMAND; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTROCHEMICAL ETCHING; ETCHING; NONMETALS; OPTICAL DESIGN; OXIDATION; SILICON;

EID: 50349100598     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEMS.2008.4484290     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 0038355686 scopus 로고    scopus 로고
    • Macroporous Si based micromachining
    • Ph.D. thesis, Delft, The Netherlands, ISBN 90-5166-90
    • H. Ohji, "Macroporous Si based micromachining", Ph.D. thesis, 2002, Delft, The Netherlands, ISBN 90-5166-90.
    • (2002)
    • Ohji, H.1
  • 2
    • 0038493949 scopus 로고    scopus 로고
    • High Aspect Ratio through-Wafer Interconnections for 3D-Microsystems
    • January 19-23, Kyoto, Japan, pp
    • L. Wang, et al "High Aspect Ratio through-Wafer Interconnections for 3D-Microsystems" Proc. 16th IEEE International MEMS conference, January 19-23, 2003, Kyoto, Japan, pp. 634-637.
    • (2003) Proc. 16th IEEE International MEMS conference , pp. 634-637
    • Wang, L.1
  • 3
    • 0036836993 scopus 로고    scopus 로고
    • H. Föll et al, Materials Science and Engineering R 39 (2002) 93-141
    • H. Föll et al, Materials Science and Engineering R 39 (2002) 93-141
  • 4
    • 26844454152 scopus 로고    scopus 로고
    • Highly controllable electrochemical etching process on silicon
    • Jan. 30-Feb. 3, Miami, USA, pp
    • Y. Chen. L.W. Wang and P.M. Sarro, "Highly controllable electrochemical etching process on silicon" Proc. 18th IEEE International MEMS Conference, Jan. 30-Feb. 3, 2005 Miami, USA, pp 512-515
    • (2005) Proc. 18th IEEE International MEMS Conference , pp. 512-515
    • Chen, Y.1    Wang, L.W.2    Sarro, P.M.3
  • 6
    • 46149113471 scopus 로고    scopus 로고
    • st IEEE-NEMS, January 18-21 2006, Zhuhai, China
    • st IEEE-NEMS, January 18-21 2006, Zhuhai, China
  • 7
    • 50349084351 scopus 로고    scopus 로고
    • Lin Jilei, et al Investigation of the Formation of undercut during the Fabrication Silicon Microchannel by Electrochemical Etching, submitted to IEEE-NEMS 2008
    • Lin Jilei, et al "Investigation of the Formation of undercut during the Fabrication Silicon Microchannel by Electrochemical Etching", submitted to IEEE-NEMS 2008
  • 8
    • 50349100207 scopus 로고    scopus 로고
    • Fabrication of a microchannel plate from a perforated silicon workpiece,
    • US patent number:5544772
    • Soave, etal, Fabrication of a microchannel plate from a perforated silicon workpiece, US patent number:5544772
    • Soave1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.