메뉴 건너뛰기




Volumn , Issue , 2006, Pages 115-119

Development of novel joint resistance modeling technique for flip chip interconnection systems

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; BRAZING; COPPER; COPPER ALLOYS; CRACKS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; TECHNOLOGY; THERMOANALYSIS;

EID: 50249153468     PISSN: 10898190     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMT.2006.4456442     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 2
    • 0033346736 scopus 로고    scopus 로고
    • A Reliable and Environmentally Friendly Packaging Technology - Flip Chip Joining Using Anisotropically Conductive Adhesive
    • Liu J. et al, "A Reliable and Environmentally Friendly Packaging Technology - Flip Chip Joining Using Anisotropically Conductive Adhesive," IEEE Trans-CPMT, Vol. 22, No. 2 (1999) pp. 186-190.
    • (1999) IEEE Trans-CPMT , vol.22 , Issue.2 , pp. 186-190
    • Liu, J.1
  • 3
    • 0033352029 scopus 로고    scopus 로고
    • The Contact Resistance and Reliability of Anisotropically Conductive Film (ACF)
    • Yim M.J. et al, "The Contact Resistance and Reliability of Anisotropically Conductive Film (ACF)", IEEE Trans Advanced Packaging, Vol.22, No.2, (1999) pp. 166-173.
    • (1999) IEEE Trans Advanced Packaging , vol.22 , Issue.2 , pp. 166-173
    • Yim, M.J.1
  • 4
    • 0030212322 scopus 로고    scopus 로고
    • Anisotropically Conductive Adhesive Flip-Chip Bonding on Rigid and Flexible Printed Circuit Substrates
    • Lai Z. et al, "Anisotropically Conductive Adhesive Flip-Chip Bonding on Rigid and Flexible Printed Circuit Substrates," IEEE Trans-CPMT-B, Vol. 19, No. 3 (1996), pp. 644-660.
    • (1996) IEEE Trans-CPMT-B , vol.19 , Issue.3 , pp. 644-660
    • Lai, Z.1
  • 5
    • 4444301669 scopus 로고    scopus 로고
    • Electrically Anisotropic Conductive Adhesives: A New Model for Conduction Mechanism
    • Shi et al, "Electrically Anisotropic Conductive Adhesives: A New Model for Conduction Mechanism", Proc. International Symposium on Advanced Packaging Materials, (1999) pp.163-168
    • (1999) Proc. International Symposium on Advanced Packaging Materials , pp. 163-168
    • Shi1
  • 7
    • 33847290441 scopus 로고    scopus 로고
    • Influence of Bump Geometry, Adhesives and Pad Finishings on the Joint Resistance of Au Bump and A/NCA Flip Chip Interconnection
    • th Electronics Packaging Technology Conf, (2005) pp. 797-801.
    • (2005) th Electronics Packaging Technology Conf , pp. 797-801
    • Tan, A.M.1
  • 9
    • 42549091465 scopus 로고    scopus 로고
    • st Electronics Systemintegration Technology Conference, (2006)
    • st Electronics Systemintegration Technology Conference, (2006)
  • 12
    • 0036890557 scopus 로고    scopus 로고
    • Failure Criteria of Flip Chip Joints during Accelerated Testing
    • Frank Stepniak, "Failure Criteria of Flip Chip Joints during Accelerated Testing", Journal of Microelectronics Reliability, Vol.42 (2002), pp. 1921-1930
    • (2002) Journal of Microelectronics Reliability , vol.42 , pp. 1921-1930
    • Stepniak, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.