Parameter reduction for variability analysis by Slice Inverse Regression (SIR) method

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2007, Pages 468-473

  Mitev, Alexander ^a   Marefat, Michael ^a   Ma, Dongsheng ^a   Wang, Janet ^a  

^a University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT PERFORMANCES; COMPUTATIONAL COSTS; DESIGN AUTOMATION CONFERENCE (DAC); DESIGN VARIABLES; EXPERIMENTAL RESULTS; GLOBAL VARIATIONS; IC DESIGNS; INVERSE REGRESSION; NEW APPROACHES; NEW GENERATION; NEW METHODS; PARAMETER REDUCTION; PROCESS PARAMETERS; PROCESS VARIABILITY; PROCESS VARIATIONS; RESPONSE SURFACES; SEMI CONDUCTOR FABRICATION; SOUTH PACIFIC; STATISTICAL VARIATIONS; TRANSFORMATION MATRICES; VARIABILITY ANALYSIS;

COMPUTER AIDED DESIGN; DIGITAL INTEGRATED CIRCUITS; FOOD PROCESSING; INDUSTRIAL ENGINEERING; MAPS; MATHEMATICAL TRANSFORMATIONS; MATRIX ALGEBRA; MECHANIZATION; OPTICAL DESIGN; PROCESS DESIGN; STATISTICAL METHODS; STATISTICS;

PROCESS ENGINEERING;

EID: 46649088771     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2007.358030     Document Type: Conference Paper

References (11)

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