Van der Pol type self-excited micro-cantilever probe of atomic force microscopy

Nonlinear Dynamics

Volumn 54, Issue 1-2, 2008, Pages 137-149

  Yabuno, Hiroshi ^a   Kaneko, Hiroyuki ^a   Kuroda, Masaharu ^b   Kobayashi, Takeshi ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscopy (AFM); Bifurcation; Biomolecule; Cantilever; Liquid, Noncontact; Micro cantilever; Nonlinear; Self excited oscillation; Van der Pol

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CHAOS THEORY; CIRCUIT OSCILLATIONS; FEEDBACK CONTROL; MICROSCOPIC EXAMINATION; MOLECULAR BIOLOGY; OPTICAL DESIGN; OSCILLATORS (ELECTRONIC); PHOTORESISTS; SCANNING PROBE MICROSCOPY; SURFACES; TRUCKS;

ASYMPTOTIC PERTURBATION; ATOMIC FORCE MICROSCOPY (AFM); BIFURCATION; BIOMOLECULE; CANTILEVER; CANTILEVER PROBES; CONTACT FORCES; EXTERNAL EXCITATIONS; IRREGULAR SURFACES; LINEAR FEEDBACK CONTROL; LIQUID ENVIRONMENTS; LIQUID, NONCONTACT; LOW-QUALITY; MICRO CANTILEVERS; MICRO-CANTILEVER; NON LINEARITIES; NON-CONTACT ATOMIC FORCE MICROSCOPY; NON-LINEAR CHARACTERISTICS; NONLINEAR; NONLINEAR FEEDBACK CONTROL; POW ERFUL TOOL; RESPONSE AMPLITUDES; SAMPLE SURFACES; SELF-EXCITED OSCILLATION; SELF-EXCITED OSCILLATIONS; SELF-EXCITED OSCILLATORS; SELF-EXCITING; SOFT MATERIALS; STEADY STATES; VAN DER POL; VAN DER POL OSCILLATORS;

IMAGING TECHNIQUES;

EID: 50249123854     PISSN: 0924090X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11071-008-9339-1     Document Type: Article

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