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Volumn , Issue , 2006, Pages 701-707

High speed ball pull - A predictor of brittle solder joints

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; BRAZING; BRITTLENESS; CORRELATION METHODS; DROPS; ELECTRONIC EQUIPMENT; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONIC EQUIPMENT TESTING; ELECTRONICS PACKAGING; FAILURE ANALYSIS; FLUID MECHANICS; FRACTURE; FRACTURE FIXATION; FRACTURE TESTING; IMPACT TESTING; INTERMETALLICS; LEAD; MECHANISMS; METALLIC COMPOUNDS; PETROLEUM DEPOSITS; PETROLEUM RESERVOIRS; PROBABILITY; QUALITY ASSURANCE; RELIABILITY; RISK ASSESSMENT; SAFETY FACTOR; SHOCK TESTING; SOLDERED JOINTS; SOLDERING; SOLDERING ALLOYS; SPEED; STATISTICAL METHODS; STRAIN RATE; TECHNOLOGY; TESTING; WELDING;

EID: 50249099339     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2006.342799     Document Type: Conference Paper
Times cited : (7)

References (6)
  • 1
    • 0347567450 scopus 로고    scopus 로고
    • Three- and four-point bend testing for electronic packages
    • Shetty S, and Reinikainen T, "Three- and four-point bend testing for electronic packages," J. of Electronic Ppackaging, Vol 125, No. 17 (2003):, pp 556-561
    • (2003) J. of Electronic Ppackaging , vol.125 , Issue.17 , pp. 556-561
    • Shetty, S.1    Reinikainen, T.2
  • 2
    • 50249137345 scopus 로고    scopus 로고
    • JEDEC Solid State Technology Association, JESD22-B111: Board level drop test method of component for handheld electronics products, 2003.
    • JEDEC Solid State Technology Association, JESD22-B111: "Board level drop test method of component for handheld electronics products", 2003.
  • 4
    • 34250689972 scopus 로고    scopus 로고
    • th IPFA, Singapore, 2006, pp 239-243
    • th IPFA, Singapore, 2006, pp 239-243.
    • Zhu, F.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.