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Volumn 6921, Issue , 2008, Pages
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Extreme ultraviolet resist outgassing and its effect on nearby optics
a
c
Qimonda
(United States)
d
AMD
(United States)
e
IBM
(United States)
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Author keywords
EUV; Extreme ultraviolet; Optics contamination; Outgassing; Witness plate
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Indexed keywords
EUV;
EUV OPTICS;
EUV RADIATION;
EUV RESISTS;
EXPOSURE DOSE;
EXPOSURE TOOL;
EXTREME ULTRAVIOLET;
EXTREME ULTRAVIOLETS;
RESIST COMPONENTS;
VACUUM ENVIRONMENT;
WITNESS PLATE;
DEGASSING;
EXTREME ULTRAVIOLET LITHOGRAPHY;
PHOTORESISTS;
OPTICS;
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EID: 50149105391
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.772670 Document Type: Conference Paper |
Times cited : (7)
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References (8)
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