Speed-up of high accurate analog test stimulus optimization

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 230-236

  Khouas, Abdelhakim ^a   Derieux, Anne ^a  

^a Universite Pierre   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; FAULT TREE ANALYSIS; MONTE CARLO METHODS; OPERATIONAL AMPLIFIERS; OPTIMIZATION; PROBABILITY DENSITY FUNCTION;

AUTOMATIC TESTING EQUIPMENT; FAULT SIMULATION ALGORITHM; INDUCTIVE FAULT ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0033317248     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)