High sensitivity cantilevers for measuring persistent currents in normal metal rings

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 4, 2008, Pages 1412-1416

  Bleszynski Jayich, A C ^a   Shanks, W E ^a   Ilic, B R ^b   Harris, J G E ^a  

^a Yale University   (United States)

^b Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BROWNIAN MOTIONS; ELECTROMAGNETIC ENVIRONMENT; HIGH SENSITIVITIES; LASER INTERFEROMETERS; METAL RINGS; MICROMECHANICAL CANTILEVERS; MICRON-SCALE; MICROWAVE RESONATORS; NEW APPROACHES; NORMAL METALS; PERSISTENT CURRENT; PERSISTENT CURRENTS; SHOT-NOISE; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE;

BROWNIAN MOVEMENT; ELECTRIC CURRENTS; ELECTROMAGNETISM; INTERFEROMETERS; MECHANICAL PROPERTIES; METALS; MICROWAVE DEVICES; OPTICAL DESIGN; QUANTUM INTERFERENCE DEVICES; SENSITIVITY ANALYSIS;

PHOTORESISTS;

EID: 49749135788     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2958247     Document Type: Article

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