Hotspot based yield prediction with consideration of correlations

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Volumn , Issue , 2008, Pages 338-343

  Su, Qing ^a   Chiang, Charles ^a   Kawa, Jamil ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL TOOLS; DESIGN FOR MANUFACTURABILITY; ELECTRONIC DESIGNS; HOT SPOTTING; INTERNATIONAL SYMPOSIUM; NEW APPROACHES; SPATIAL CORRELATIONS; SYSTEMATIC YIELD; TOTAL YIELD; VLSI TECHNOLOGIES; YIELD PREDICTIONS;

CORRELATION METHODS; ELECTRONICS ENGINEERING; MACHINE DESIGN;

FORECASTING;

EID: 49749132516     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479752     Document Type: Conference Paper

References (10)

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