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Volumn 271, Issue 1-2, 2004, Pages 105-112

Growth and characterization of vertically aligned self-assembled IrO 2 nanotubes on oxide substrates

Author keywords

Field emission scanning electron microscopy; IrO2; Metalorganic chemical vapor deposition; Nanotube; Transmission electron microscopy; X ray diffractometry; X ray photoelectron spectroscopy

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; DIFFRACTOMETERS; FIELD EMISSION MICROSCOPES; IRIDIUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 4944237528     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.07.036     Document Type: Article
Times cited : (63)

References (28)
  • 22
    • 4944255587 scopus 로고    scopus 로고
    • JCPDS Card No. 15-0870, International Centre for Diffraction Data, Newtown Square, PA, USA
    • JCPDS Card No. 15-0870, International Centre for Diffraction Data, Newtown Square, PA, USA.
  • 23
    • 4944252250 scopus 로고    scopus 로고
    • JCPDS Card No. 10-0173, International Centre for Diffraction Data, Newtown Square, PA, USA
    • JCPDS Card No. 10-0173, International Centre for Diffraction Data, Newtown Square, PA, USA.
  • 24
    • 4944252249 scopus 로고    scopus 로고
    • JCPDS Card No. 20-0631, International Centre for Diffraction Data, Newtown Square, PA, USA
    • JCPDS Card No. 20-0631, International Centre for Diffraction Data, Newtown Square, PA, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.