Growth and characterization of OsO2 single crystals

Journal of Crystal Growth

Volumn 262, Issue 1-4, 2004, Pages 271-276

  Yen, P C ^a   Chen, R S ^a   Chen, C C ^a   Huang, Y S ^a   Tiong, K K ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

A1. Characterization; A1. X ray diffraction; A2. Single crystal growth; B1. Oxides

Indexed keywords

CRYSTAL GROWTH; CRYSTAL LATTICES; DIFFRACTOMETERS; ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL VAPOR TRANSPORT; ROOM TEMPERATURE (RT);

OSMIUM COMPOUNDS;

EID: 0842308454     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.10.021     Document Type: Article

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