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Volumn 516, Issue 21, 2008, Pages 7903-7909

Comparative study of the characteristics of Ni films deposited on SiO2/Si(100) by oblique-angle sputtering and conventional sputtering

Author keywords

Magnetization; Ni film; Oblique angle sputtering; Resistivity; Structural properties

Indexed keywords

NICKEL ALLOYS; SILICON COMPOUNDS;

EID: 49349093007     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.056     Document Type: Article
Times cited : (17)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.