![]() |
Volumn 516, Issue 21, 2008, Pages 7903-7909
|
Comparative study of the characteristics of Ni films deposited on SiO2/Si(100) by oblique-angle sputtering and conventional sputtering
|
Author keywords
Magnetization; Ni film; Oblique angle sputtering; Resistivity; Structural properties
|
Indexed keywords
NICKEL ALLOYS;
SILICON COMPOUNDS;
COMPARATIVE STUDIES;
MAGNETIZATION;
NI FILM;
NI FILMS;
OBLIQUE-ANGLE SPUTTERING;
RESISTIVITY;
STRUCTURAL PROPERTIES;
NICKEL;
|
EID: 49349093007
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.04.056 Document Type: Article |
Times cited : (17)
|
References (22)
|