Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films

Thin Solid Films

Volumn 516, Issue 21, 2008, Pages 7511-7518

  Kovalskiy, A ^a   Neilson, J R ^a   Miller, A C ^a   Miller, F C ^b   Vlcek, M ^c   Jain, H ^a  

^a Lehigh University   (United States)

^b LEHIGH UNIVERSITY   (United States)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Electron induced effects; Glass; Photo induced effects; X ray photoelectron spectroscopy (XPS)

Indexed keywords

CHEMICAL COMPOSITIONS; COMPARATIVE STUDIES; ELECTRON-INDUCED EFFECTS; GLASS; PHOTO-INDUCED; PHOTO-INDUCED EFFECTS; STRUCTURAL TRANSFORMATIONS; X-RAY PHOTOELECTRON SPECTROSCOPY (XPS);

ELECTRONIC STRUCTURE;

EID: 49349084045     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.054     Document Type: Article

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