Characterization of refractive index change induced by electron irradiation in amorphous thin As2S3 films

Journal of Applied Physics

Volumn 82, Issue 4, 1997, Pages 1521-1524

  Nordman, Nina ^a   Nordman, Olli ^b  

^a UNIVERSITY OF EASTERN FINLAND   (Finland)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004738179     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365952     Document Type: Article

References (11)

1. T. Suhara, H. Nishihara, and J. Koyama, Jpn. J. Appl. Phys. 14, 1079 (1975).
2. H. Nishihara, Y. Handa, T. Suhara, and J. Koyama, Appl. Opt. 17, 2342 (1978).
3. Y. Handa, T. Suhara, H. Nishihara, and H. Koyama, Appl. Opt. 18, 248 (1978).
4. Y. Handa, T. Suhara, H. Nishihara, and H. Koyama, Appl. Opt. 19, 2842 (1980).
5. Y. Handa, T. Suhara, H. Nishihara, and H. Koyama, Opt. Lett. 5, 309 (1980).
6. S. A. Sergeev, A. A. Simashkevich, and S. D. Shutov, Quantum Electron. 24, 924 (1994).
7. N. Nordman, O. Salminen, M. Kuittinen, and J. Turunen, J. Appl. Phys. 80, 3683 (1996).
8. N. Nordman and O. Salminen, Solid State Commun. 100, 241 (1996).
9. A. Ozols, O. Salminen, and M. Reinfelde, J. Appl. Phys. 75, 3326 (1994).
10. G. Pfeiffer, M. A. Paesler, and S. C. Agarwal, J. Non-Cryst. Solids 130, 111 (1991).
11. K. Case, C. G. Chern, and I. Luaks, Thin Solid Films 116, L53 (1984).