Thermal stability of SrFeO3/Al2O3 thin films: Transmission electron microscopy study and conductometric sensing response

Journal of Applied Physics

Volumn 104, Issue 2, 2008, Pages

  Wang, Dashan ^a   Tunney, James J ^a   Du, Xiaomei ^a   Post, Michael L ^a   Gauvin, Raynald ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

THERMAL STABILITY;

THERMODYNAMIC STABILITY;

EID: 48849096760     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2957073     Document Type: Article

References (35)

1. J. P. Hodges, S. Short, J. D. Jorgensen, X. Xiong, B. Dabrowski, S. M. Mini, and C. W. Kimball, J. Solid State Chem. 0022-4596 10.1006/jssc.1999.8640 151, 190 (2000).
2. Y. Takeda, K. Kanno, T. Takada, O. Yamamoto, M. Takano, N. Nakayama, and Y. Bando, J. Solid State Chem. 0022-4596 10.1016/0022-4596(86)90174-X 63, 237 (1986).
3. M. L. Post, B. W. Sanders, and P. Kennepohl, Sens. Actuators B 13, 272 (1993).
4. J. J. Tunney and M. L. Post, J. Electroceram. 5, 63 (2000).
5. S. Wißmann and K. D. Becker, Solid State Ionics 85, 279 (1996). 0167-2738
6. J. Hombo, Y. Matsumoto, and T. Kawano, J. Solid State Chem. 0022-4596 10.1016/0022-4596(90)90192-Z 84, 138 (1990).
7. K. Ichimura, Y. Inoue, I. Yasumori, B. Viswanathan, and T. Arakawa, in Properties and Applications of Perovskite-Type Oxides, edited by, L. G. Tejuca, and, J. L. G. Fierro, (Marcel Dekker, New York, 1993), pp. 235, 271, 361.
8. D. E. Williams, in Solid State Gas Sensors, edited by, P. T. Moseley, and, B. C. Tofield, (The Adam Hilger Series on Sensors, Bristol, Philadelphia, 1987), Chap..
9. G. Eranna, B. C. Joshi, D. P. Runthala, and R. P. Gupta, Crit. Rev. Solid State Mater. Sci. 1040-8436 10.1080/10408430490888977 29, 111 (2004).
10. M. L. Post, J. J. Tunney, D. Yang, X. Du, and D. L. Singleton, Sens. Actuators B 59, 190 (1999).
11. J. J. Tunney, M. L. Post, X. Du, and D. Yang, J. Electrochem. Soc. 0013-4651 10.1149/1.1470661 149, H113 (2002).
12. G. Martinelli, M. C. Carotta, M. Ferroni, Y. Sadaoka, and E. Traversa, Sens. Actuators B 55, 99 (1999).
13. K. Sahner, R. Moos, M. Matam, J. J. Tunney, and M. L. Post, Sens. Actuators B 108, 102 (2005).
14. N. Barsan and U. Weimar, J. Electroceram. 1385-3449 10.1023/A: 1014405811371 7, 143 (2001).
15. C. Xu, J. Tamaki, N. Miura, and N. Yamazoe, Sens. Actuators B 3, 147 (1991).
16. D. E. Williams and K. F. E. Pratt, Sens. Actuators B 70, 214 (2000).
17. Z. Wang, T. Sasaki, N. Koshizaki, J. J. Tunney, and M. L. Post, Thin Solid Films 0040-6090 10.1016/S0040-6090(03)00614-X 437, 95 (2003).
18. B. R. Sanders, J. Yao, and M. L. Post, Polycrystalline Thin Films: Structure, Texture, Properties and Applications, edited by, K. Barmak, M. A. Parker, J. A. Floro, R. Sinclair, and, D. A. Smith, Materials Research Society Symposium Proceedings No.343, San Francisco, U.S.A 1994), p. 463.
19. J. J. Tunney, P. Whitfield, X. Du, and M. L. Post, Thin Solid Films 0040-6090 426, 221 (2003).
20. R. Moos, F. Rettig, A. Hürland, and C. Plog, Sens. Actuators B 93, 43 (2003).
21. S. J. Litzelman, A. Rothschild, and H. L. Tuller, Sens. Actuators B 108, 231 (2005).
22. X. F. Chen, H. Lu, W. G. Zhu, and O. K. Tan, Surf. Coat. Technol. 198, 266 (2005).
23. S. H. Oh and C. -G. Park, Surf. Interface Anal. 0142-2421 10.1002/sia.1104 31, 796 (2001).
24. X. B. Lu, X. Zhang, R. Huang, H. B. Lu, Z. H. Chen, W. F. Xiang, M. He, B. L. Cheng, H. W. Zhou, X. P. Wang, C. Z. Wang, and B. Y. Nguyen, Appl. Phys. Lett. 0003-6951 10.1063/1.1690880 84, 2620 (2004).
25. X. B. Lu, Z. G. Liu, G. H. Shi, H. Q. Ling, H. W. Zhou, X. P. Wang, and B. Y. Nguyen, Appl. Phys. A: Mater. Sci. Process. 0947-8396 10.1007/s00339-003- 2090-z 78, 921 (2004).
26. J. Q. He, C. L. Jia, V. Vaithyanathan, D. G. Schlom, J. Schubert, A. Gerber, H. H. Kohlstedt, and R. H. Wang, J. Appl. Phys. 0021-8979 10.1063/1.1915519 97, 104921 (2005).
27. D. Wang, J. J. Tunney, X. Du, M. L. Post, and R. Gauvin, J. Mater. Res. 0884-2914 10.1557/jmr.2007.0020 22, 1, (2007).
28. B. W. Sanders and M. L. Post, Laser Ablation in Materials Processing: Fundamentals and Applications edited by, B. Braren, J. J. Dubowski, and, D. P. Norton, (Materials Resarch Society, Pittsburgh PA 1993) Symposium Proceedings Vol. 285, p. 427.
29. P. J. Goodhew, Specimen Preparation for Transmission Electron Microscopy of Materials (Oxford University Press, New York, 1984).
30. D. G. Ivey and G. R. Piercy, J. Electron Microsc. Tech. 0741-0581 10.1002/jemt.1060080215 8, 233 (1988).
31. M. L. Post, J. J. Tunney, and J. Yao, Chemical and Biological Sensors and Analytical Electrochemical Methods, The Electrochemical Society Proceedings Series, edited by, A. J. Ricco, M. A. Butler, P. Wanysek, G. Horvai, and, A. F. Silva, (The Electrochemical Society, Inc., Pennington, NJ, 1977), p. 889.
32. J. C. H. Spence and J. M. Zuo, Electron Microdiffraction (Plenum Press, New York, London, 1992), p. 158.
33. M. H. Loretto, Electron Beam Analysis of Materials (Chapman and Hall, London, 1984), p. 88.
34. B. F. Buxton, J. A. Eades, J. W. Steeds, and G. M. Rackham, Philos. Trans. R. Soc. London, Ser. A 281, 171 (1976).
35. Edded by, J. A. Dean, Lange's Handbook of Chemistry, 15th ed. (McGraw-Hill, New York, 1999), p. 528.