Microstructure effects on the response of gas-sensitive resistors based on semiconducting oxides

Sensors and Actuators, B: Chemical

Volumn 70, Issue 1-3, 2000, Pages 214-221

  Williams, David E ^a   Pratt, Keith F E ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL MICROSTRUCTURE; CRYSTALS; NUMERICAL METHODS; OXIDE SUPERCONDUCTORS; POISSON DISTRIBUTION;

DEBYE LENGTH; ELEMENTARY CUBES; GAS SENSITIVE RESISTORS; KEY SCALING VARIABLE; MICROSTRUCTURE EFFECTS; SEMICONDUCTING OXIDES;

CHEMICAL SENSORS;

EID: 0034322596     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(00)00572-4     Document Type: Article

References (12)

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