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Volumn 570, Issue 2 SPEC. ISS., 2007, Pages 317-321
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First electrical characterization of 3D detectors with electrodes of the same doping type
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Author keywords
3D detectors; DRIE etching; Electrical characterization; Fabrication technology; Silicon detectors
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Indexed keywords
COLLIDING BEAM ACCELERATORS;
DOPING (ADDITIVES);
ELECTRIC BREAKDOWN;
ELECTRODES;
LEAKAGE CURRENTS;
RADIATION HARDENING;
SILICON SENSORS;
ELECTRICAL CHARACTERIZATION;
FABRICATION TECHNOLOGY;
LARGE HYDREN COLLIDERS (LHC);
SILICON RADIATION;
PARTICLE DETECTORS;
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EID: 33845916869
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.09.032 Document Type: Article |
Times cited : (20)
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References (7)
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