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Volumn , Issue , 2007, Pages 1018-1022

High-voltage, high-frequency SiC power MOSFETs model validation

Author keywords

[No Author keywords available]

Indexed keywords

BEHAVIORAL RESEARCH; CIRCUIT SIMULATION; MOSFET DEVICES; SILICON CARBIDE;

EID: 48349091978     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2007.4342130     Document Type: Conference Paper
Times cited : (10)

References (8)
  • 1
    • 34848913574 scopus 로고    scopus 로고
    • Status of High-Voltage, High-Frequency Silicon-Carbide Power Devices
    • San Diego, CA, March
    • A. Hefner, "Status of High-Voltage, High-Frequency Silicon-Carbide Power Devices," in 31st GOMACTech Conf., San Diego, CA, March 2006, pp. 232-235.
    • (2006) 31st GOMACTech Conf , pp. 232-235
    • Hefner, A.1
  • 4
    • 0029267581 scopus 로고
    • Modeling Buffer Layer IGBT's for Circuit Simulation
    • March
    • A.R. Hefner, "Modeling Buffer Layer IGBT's for Circuit Simulation," in IEEE Transactions on Power Electronics, vol. 10, no. 2, March 1995, pp. 111-123.
    • (1995) IEEE Transactions on Power Electronics , vol.10 , Issue.2 , pp. 111-123
    • Hefner, A.R.1
  • 8
    • 34848827896 scopus 로고    scopus 로고
    • Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization
    • Tampa, FL, October
    • D. Berning, A. Hefner, J.M. Ortiz-Rodríguez, C. Hood, and A. Rivera "Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization," in Recs. of IAS IEEE Ind. Apps. Conf., vol. 1. Tampa, FL, October 2006, pp. 338-345.
    • (2006) Recs. of IAS IEEE Ind. Apps. Conf , vol.1 , pp. 338-345
    • Berning, D.1    Hefner, A.2    Ortiz-Rodríguez, J.M.3    Hood, C.4    Rivera, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.