Generalized test bed for high-voltage, high-power SiC device characterization

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 1, Issue , 2006, Pages 338-345

  Berning, David ^a   Hefner, Allen ^a   Ortiz Rodriguez, Jose M ^a   Hood, Colleen ^a   Rivera, Angel ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Curve tracer; DUT; High power; High voltage MOSFET; Inductive load switching; Parametric testing; Power conversion; Semiconductor device characterization; SiC

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC RESISTANCE MEASUREMENT; LINEAR SYSTEMS; POWER ELECTRONICS; SILICON CARBIDE;

CURVE TRACER; HIGH VOLTAGE MOSFET; INDUCTIVE LOAD SWITCHING; PARAMETRIC TESTING; POWER CONVERSION;

EQUIPMENT TESTING;

EID: 34848827896     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IAS.2006.256543     Document Type: Conference Paper

References (7)

1. R. Singh, K. G. Irvine, D. C. Capell, J. T. Richmond, D. Berning, A. R. Hefner, and J. W. Palmour, "Large Area, Ultra-high Voltage 4H-SiC p-i-n Rectifiers," IEEE Trans. on Electron Devices, Vol. 49, no. 12, pp. 2308-2316, Dec. 2002.
2. S.H. Ryu, et al., "10 kV, 123 mΩ-cm2 4H-SiC Power DMOSFETs," IEEE Electron Device Letters, Vol. 25, No. 8, pp.556-558, Aug. 2004.
3. Electric Power Research Institute (EPRI), 3412 Hillview Avenue, Palo Alto, California 94304, http://www.epri.com
4. Defense Advanced Research Projects Agency (DARPA), Microelectronic Technology Office (MTO), Wide Bandgap Semiconductor Technology High Power Electronics Program (WBG-HPE), BAA#06-30, Wide Bandgap Semiconductor Technology High Power Electronics, http://www.darpa.mil/mto/solicitations/index.html
5. D. Berning, "Output Transformerless Amplifier Impedance Matching Apparatus," US Patent 5,612,646, March 1997.
6. http://powerelectronics.com/news/silicon-carbide-components/
7. J.C. Zolper, "Emerging Silicon Carbide Power Electronics Components," IEEE Applied Power Electronics Conference Proceedings, Austin, TX, March 2005.