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Volumn , Issue , 2007, Pages 548-550

Effects of atmosphere on the reliability of RF-MEMS capacitive switches

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT ATMOSPHERE; CAPACITIVE SWITCHING; CHARGING MECHANISMS; DRY ENVIRONMENT; EUROPEAN; MEMS SWITCHES; RF-MEMS; RF-MEMS SWITCHES; SURFACE CHARGING;

EID: 48149085137     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMICC.2007.4412771     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 3
    • 2342642163 scopus 로고    scopus 로고
    • A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
    • Jan
    • W. M. van Spengen, R. Puers, R. Mertens, and I. De Wolf, "A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches," J. Micromech. Microeng., vol. 14, pp. 514-521, Jan. 2004.
    • (2004) J. Micromech. Microeng , vol.14 , pp. 514-521
    • van Spengen, W.M.1    Puers, R.2    Mertens, R.3    De Wolf, I.4
  • 4
    • 33646069253 scopus 로고    scopus 로고
    • Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches
    • June
    • X. Yuan, J. C. M. Hwang, D. Forehand, and C. L. Goldsmith, "Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches," IEEE MTT-S Int. Microwave Symp. Dig., pp. 753-756, June 2005.
    • (2005) IEEE MTT-S Int. Microwave Symp. Dig , pp. 753-756
    • Yuan, X.1    Hwang, J.C.M.2    Forehand, D.3    Goldsmith, C.L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.