Correction terms and approximations for atom location by channelling enhanced microanalysis

Ultramicroscopy

Volumn 80, Issue 2, 1999, Pages 109-124

  Oxley, M P ^a   Allen, L J ^a   Rossouw, C J ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b CSIRO   (Australia)

Author keywords

Inelastic electron scattering theory; X ray microanalysis

Indexed keywords

ALUMINUM; ATOMS; COBALT; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; IONIZATION; MATHEMATICAL MODELS; MOLECULAR ORIENTATION; X RAYS;

ATOM LOCATION BY CHANNELING ENHANCED MICROANALYSIS; ELECTRON BEAM IRRADIATION; HARTREE FOCK ATOMIC BOUND STATE WAVE FUNCTIONS; INTERACTION KERNEL;

MICROANALYSIS;

ARTICLE; CALCULATION; ELECTRON BEAM; ELECTRON DIFFRACTION; ENERGY; IONIZATION; MATHEMATICAL MODEL; RADIATION SCATTERING; X RAY MICROANALYSIS;

EID: 0033214344     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00101-1     Document Type: Article

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