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Volumn 310, Issue 16, 2008, Pages 3825-3832

Optimization of the cooling profile to achieve crack-free Yb:S-FAP crystals

Author keywords

A1. Defect; A1. Stresses; A2. Czochralski method; A2. Single crystal growth; B1. Oxides; B3. Laser diodes

Indexed keywords

CRYSTALLOGRAPHY;

EID: 48049106673     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.05.041     Document Type: Article
Times cited : (19)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.