Immuno-repairing of FPGA designs

IFIP International Federation for Information Processing

Volumn 268, Issue , 2008, Pages 137-149

  Montealegre, Norma ^a   Rammig, Franz J ^b  

^a UNIVERSITY OF PADERBORN   (Germany)

^b NONE

Author keywords

Autonomic systems; BIST; Fault tolerance; FPGA; Immunocomputing

Indexed keywords

BUILT-IN SELF TEST; DESIGN; ERROR DETECTION; FAULT DETECTION; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); HARDWARE; INTEGRATED CIRCUIT DESIGN; REPAIR; SEMICONDUCTOR DEVICE MANUFACTURE; SYSTEMS ANALYSIS; FAULT TOLERANCE;

AUTONOMIC SYSTEMS; COMPUTING TECHNIQUES; ERROR-DETECTION TECHNIQUES; FAULT TOLERANCE TECHNIQUES; FAULT TOLERANT DESIGN; HARDWARE IMPLEMENTATIONS; IMMUNOCOMPUTING; ON-LINE DETECTION;

FAULT TOLERANCE; FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 47849129838     PISSN: 15715736     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-0-387-09655-1_13     Document Type: Conference Paper

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