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Volumn , Issue , 2000, Pages 168-174
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On-line built-in self-test for operational faults
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Author keywords
[No Author keywords available]
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Indexed keywords
DIGITAL DEVICES;
ERROR DETECTION;
FAILURE ANALYSIS;
ONLINE SYSTEMS;
REAL TIME SYSTEMS;
REDUNDANCY;
SYSTEMS ANALYSIS;
CIRCUIT UNDER TEST;
DIGITAL SYSTEMS;
ONLINE TESTING;
OPERATIONAL FAULTS;
BUILT-IN SELF TEST;
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EID: 0034480928
PISSN: 07347510
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (15)
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References (10)
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