Some physical properties of copper oxide films: The effect of substrate temperature

Materials Chemistry and Physics

Volumn 111, Issue 2-3, 2008, Pages 351-358

  Kose, S ^a   Atay, F ^a   Bilgin, V ^b   Akyuz, I ^a  

^a ESKISEHIR OSMANGAZI UNIVERSITY   (Turkey)

^b ÇANAKKALE ONSEKIZ MART UNIVERSITY   (Turkey)

Author keywords

Electrical characterisation; Electron microscopy; Optical properties; Thin films

Indexed keywords

ABSORPTION; CHEMICAL REACTIONS; COPPER; COPPER OXIDES; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; OPTICAL BAND GAPS; OPTICAL PROPERTIES; OXIDE FILMS; PARAMETER ESTIMATION; PHOTOACOUSTIC EFFECT; PHYSICAL PROPERTIES; PYROLYSIS; SEMICONDUCTING CADMIUM TELLURIDE; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES; SUBSTRATES; SURFACE PROPERTIES; ULTRASONIC APPLICATIONS; ULTRASONIC TESTING; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

(1 1 0) SURFACE; (PL) PROPERTIES; BAND GAPS; COPPER OXIDE FILMS; CUBIC STRUCTURES; CURRENT VOLTAGE; DISLOCATION DENSITIES; ELEMENTAL ANALYSIS (EA); ELSEVIER (CO); ENERGY DISPERSIVE X RAY SPECTROSCOPY (EDXS); FILM STRUCTURES; GRAIN SIZES; LATTICE PARAMETERS; LINEAR ABSORPTION COEFFICIENTS; OPTICAL (PET) (OPET); OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL METHODS; PROBE TECHNIQUE; REFLECTION SPECTRUM; SUBSTRATE TEMPERATURE (ST); ULTRASONIC SPRAY PYROLYSIS TECHNIQUE; X RAY DIFFRACTION (XRD);

OPTICAL FILMS;

EID: 47749107549     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.04.025     Document Type: Article

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