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Volumn 93, Issue 2, 2008, Pages

Germanium oxynitride (GeOxNy) as a back interface passivation layer for Germanium-on-insulator substrates

Author keywords

[No Author keywords available]

Indexed keywords

NITRIDES;

EID: 47549089199     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2960345     Document Type: Article
Times cited : (8)

References (21)
  • 13
    • 47549116811 scopus 로고    scopus 로고
    • 12th Int. Symposium on Silicon on Insulator Technology and Devices, 207th Meeting of the Electrochemical Society, Quebec, Canada, 15-20 May (unpublished).
    • N. Bresson, F. Allibert, and S. Cristoloveanu, 12th Int. Symposium on Silicon on Insulator Technology and Devices, 207th Meeting of the Electrochemical Society, Quebec, Canada, 15-20 May 2005 (unpublished).
    • (2005)
    • Bresson, N.1    Allibert, F.2    Cristoloveanu, S.3
  • 17
    • 47549109128 scopus 로고    scopus 로고
    • NIST electron inelastic mean free path database 1.1.
    • C. J. Powell and A. Jablonski, NIST electron inelastic mean free path database 1.1 (2000).
    • (2000)
    • Powell, C.J.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.