SPICE simulation of electro-thermal effects in new-generation multicellular VDMOS transistors

2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings

Volumn 1, Issue , 2002, Pages 201-204

  D'Alessandro, V ^a   Frisina, F ^b   Rinaldi, N ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS;

ACCURATE PREDICTION; AUTOMATICALLY GENERATED; DEVICE CHARACTERISTICS; ELECTRO-THERMAL EFFECTS; LOW-VOLTAGE APPLICATIONS; TEMPERATURE RANGE; THERMAL INTERACTION; THERMAL PHENOMENA;

SPICE;

EID: 47249160996     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIEL.2002.1003174     Document Type: Conference Paper

References (11)

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10. MEDICI, Avant! Corporation, TCAD Business Unit, 2000.
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