Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

65th DRC Device Research Conference

Volumn , Issue , 2007, Pages 67-68

  Horio, K ^a   Nakajima, A ^a   Itagaki, K ^a  

^a SHIBAURA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47249159971     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2007.4373653     Document Type: Conference Paper

References (10)

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