메뉴 건너뛰기




Volumn 29, Issue 7, 2008, Pages 671-673

Novel delta-doped InAlGaP/GaAs heterojunction bipolar transistor

Author keywords

Barrier height; Delta doped; Ebers Moll model; Heterojunction bipolar transistor (HBT); InAlGaP; Metalorganic chemical vapor deposition (MOCVD); Offset voltage; Temperature; Valence band discontinuity

Indexed keywords

BICMOS TECHNOLOGY; BIPOLAR TRANSISTORS; HETEROJUNCTION BIPOLAR TRANSISTORS; TRANSISTORS;

EID: 47249108177     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.2000604     Document Type: Article
Times cited : (10)

References (14)
  • 1
    • 21544482706 scopus 로고
    • Determination of valence and conduction-band discontinuities at the (Ga,In)P/GaAs heterojunction by C-V profiling
    • Jan
    • M. A. Rao, E. J. Caine, H. Kroemer, S. I. Ling, and D. I. Babic, "Determination of valence and conduction-band discontinuities at the (Ga,In)P/GaAs heterojunction by C-V profiling," J. Appl. Phys. vol. 61, no. 2, pp. 643-649, Jan. 1987.
    • (1987) J. Appl. Phys , vol.61 , Issue.2 , pp. 643-649
    • Rao, M.A.1    Caine, E.J.2    Kroemer, H.3    Ling, S.I.4    Babic, D.I.5
  • 2
    • 0000536410 scopus 로고
    • Interface properties for GaAs/InGaAlP heterojunctions by the capacitance-voltage profiling technique
    • Apr
    • M. O. Watanabe and Y. Ohba, "Interface properties for GaAs/InGaAlP heterojunctions by the capacitance-voltage profiling technique," Appl. Phys. Lett., vol. 50, no. 14, pp. 906-908, Apr. 1987.
    • (1987) Appl. Phys. Lett , vol.50 , Issue.14 , pp. 906-908
    • Watanabe, M.O.1    Ohba, Y.2
  • 3
    • 0000781134 scopus 로고
    • Internal photoemission and energy-band offsets in GaAs-GaInP p-I-N heterojunction photodiodes
    • Feb
    • M. A. Haase, M. J. Hafich, and G. Y. Robinson, "Internal photoemission and energy-band offsets in GaAs-GaInP p-I-N heterojunction photodiodes," Appl. Phys. Lett., vol. 58, no. 6, pp. 616-618, Feb. 1991.
    • (1991) Appl. Phys. Lett , vol.58 , Issue.6 , pp. 616-618
    • Haase, M.A.1    Hafich, M.J.2    Robinson, G.Y.3
  • 4
    • 13344282703 scopus 로고    scopus 로고
    • Characterization and modeling of three-terminal heterojunction phototransistors using an InGaP layer for passivation
    • Feb
    • S. W. Tan, H. R. Chen, W. T. Chen, M. K. Hsu, A. H. Lin, and W. S. Lour, "Characterization and modeling of three-terminal heterojunction phototransistors using an InGaP layer for passivation," IEEE Trans. Electron Devices, vol. 52, no. 2, pp. 204-210, Feb. 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.2 , pp. 204-210
    • Tan, S.W.1    Chen, H.R.2    Chen, W.T.3    Hsu, M.K.4    Lin, A.H.5    Lour, W.S.6
  • 5
    • 0026221112 scopus 로고
    • An improved heterostructure-emitter bipolar transistor (HEBT)
    • Sep
    • W. C. Liu and W. S. Lour, "An improved heterostructure-emitter bipolar transistor (HEBT)," IEEE Electron Device Lett., vol. 12, no. 9, pp. 474-476, Sep. 1991.
    • (1991) IEEE Electron Device Lett , vol.12 , Issue.9 , pp. 474-476
    • Liu, W.C.1    Lour, W.S.2
  • 6
    • 0033321356 scopus 로고    scopus 로고
    • A novel InP/InAlGaAs negative-differential-resistance heterojunction bipolar transistor (NDR-HBT) with increasing topee-shaped current-voltage characteristics
    • Oct
    • W. C. Liu, W. C. Wang, J. Y. Chen, H. J. Pan, S. Y. Cheng, K. B. Thei, and W. L. Chang, "A novel InP/InAlGaAs negative-differential-resistance heterojunction bipolar transistor (NDR-HBT) with increasing topee-shaped current-voltage characteristics," IEEE Electron Device Lett., vol. 20, no. 10, pp. 510-513, Oct. 1999.
    • (1999) IEEE Electron Device Lett , vol.20 , Issue.10 , pp. 510-513
    • Liu, W.C.1    Wang, W.C.2    Chen, J.Y.3    Pan, H.J.4    Cheng, S.Y.5    Thei, K.B.6    Chang, W.L.7
  • 9
    • 0032653049 scopus 로고    scopus 로고
    • Temperature dependence of InGaP/GaAs heterojunction bipolar transistor DC and small-signal behavior
    • Apr
    • D. A. Ahmari, G. Raghavan, Q. J. Hartmann, M. L. Hattendorf, M. Feng, and G. E. Stillmann, "Temperature dependence of InGaP/GaAs heterojunction bipolar transistor DC and small-signal behavior," IEEE Trans. Electron Devices, vol. 46, no. 4, pp. 634-640, Apr. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.4 , pp. 634-640
    • Ahmari, D.A.1    Raghavan, G.2    Hartmann, Q.J.3    Hattendorf, M.L.4    Feng, M.5    Stillmann, G.E.6
  • 11
    • 5544221397 scopus 로고
    • Energy band alignment in GaAs:(Al,Ga)As heterostructures: The dependence on alloy composition
    • Jan
    • J. Batey and S. L. Wright, "Energy band alignment in GaAs:(Al,Ga)As heterostructures: The dependence on alloy composition," J. Appl. Phys., vol. 59, no. 1, pp. 200-209, Jan 1986.
    • (1986) J. Appl. Phys , vol.59 , Issue.1 , pp. 200-209
    • Batey, J.1    Wright, S.L.2
  • 13
    • 36549096960 scopus 로고
    • Collector-emitter offset voltage in AlGaAs/GaAs heterojunction bipolar transistors
    • Aug
    • N. Chand, R. Fischer, and H. Morkoç, "Collector-emitter offset voltage in AlGaAs/GaAs heterojunction bipolar transistors," Appl. Phys. Lett., vol. 47, no. 3, pp. 313-315, Aug. 1985.
    • (1985) Appl. Phys. Lett , vol.47 , Issue.3 , pp. 313-315
    • Chand, N.1    Fischer, R.2    Morkoç, H.3
  • 14
    • 0025508937 scopus 로고
    • The DC characteristics of GaAs/AlGaAs heterojunction bipolar transistors with application to device modeling
    • Oct
    • M. E. Hafizi, C. R. Crowell, and M. E. Grupen, "The DC characteristics of GaAs/AlGaAs heterojunction bipolar transistors with application to device modeling," IEEE Trans. Electron Devices, vol. 37, no. 10, pp. 2121-2129, Oct. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , Issue.10 , pp. 2121-2129
    • Hafizi, M.E.1    Crowell, C.R.2    Grupen, M.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.