The binary dissector: Phase contrast tomography of two- and three-material objects from few projections

Optics Express

Volumn 16, Issue 14, 2008, Pages 10736-10749

  Myers, G R ^a   Gureyev, T E ^b   Paganin, D M ^a,b   Mayo, S C ^b  

^a MONASH UNIVERSITY   (Australia)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA; X RAYS;

COMPONENT MATERIALS; INFORMATION REQUIREMENT; MATERIAL OBJECTS; PHASE CONTRAST TOMOGRAPHY; PHASE-CONTRAST IMAGING; PROJECTION IMAGE; TOMOGRAPHIC TECHNIQUES; X-RAY COMPUTED TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

SILICON DIOXIDE; WATER;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER ASSISTED TOMOGRAPHY; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; PHASE CONTRAST MICROSCOPY; RADIATION SCATTERING; TOMOGRAPHY;

ALGORITHMS; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, PHASE-CONTRAST; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; SCATTERING, RADIATION; SILICON DIOXIDE; TOMOGRAPHY; TOMOGRAPHY, X-RAY COMPUTED; WATER;

EID: 47249093244     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.010736     Document Type: Article

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