Structural and optical characterization of oriented LiTaO3 thin films deposited by sol-gel technique

EPJ Applied Physics

Volumn 43, Issue 1, 2008, Pages 65-71

  Youssef, S ^a   Al Asmar, R ^b   Podlecki, J ^a   Sorli, B ^a   Foucaran, A ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b HOLY SPIRIT UNIVERSITY OF KASLIK USEK   (Lebanon)

Author keywords

[No Author keywords available]

Indexed keywords

(PL) PROPERTIES; ABSORBANCE MEASUREMENTS; ANNEALING TEMPERATURE (TA); BAND GAP ENERGIES; BULK VALUES; FOURIER TRANSFORM INFRARED (FT-IR); GRAIN SIZES; HEATING TEMPERATURES; IN ORDER; LINE WIDTHS; LITHIUM TANTALITE; OPTICAL (PET) (OPET); OPTICAL CHARACTERIZATIONS; OPTICAL PHONONS; OPTICAL TRANSMITTANCE (T); RAMAN BACKSCATTERING (RBS); SAPPHIRE SUBSTRATES; SOL-GEL PROCESSING; X-RAY DIFFRACTION MEASUREMENTS; ZONE CENTER (ZC);

ALKALI METALS; ANNEALING; CLADDING (COATING); COLLOIDS; DEPOSITS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; GELATION; LITHIUM; OPTICAL PROPERTIES; OXIDE MINERALS; SEMICONDUCTING CADMIUM TELLURIDE; SOLIDS; SPIN COATING; STEEL ANALYSIS; STRUCTURAL PROPERTIES; THICK FILMS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY FILMS;

OPTICAL FILMS;

EID: 46749157992     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2008122     Document Type: Article

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