Technique to measure contact angle of micro/nanodroplets using atomic force microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 26, Issue 4, 2008, Pages 777-782

  Jung, Yong Chae ^a   Bhushan, Bharat ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

(001) PARAMETER; ATOMIC FORCE (AF); DROPLET SIZES; MEASUREMENT TECHNIQUES; NANO-DROPLETS; NANOSCALE DISPENSING;

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; DROP FORMATION; DROPS; FLUID MECHANICS; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

CONTACT ANGLE;

EID: 46449099408     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2832409     Document Type: Article

References (33)

1. B. Bhushan, Handbook of Micro/Nanotribology, 2nd ed. (CRC Press, Boca Raton, FL, 1999).
2. B. Bhushan, Introduction to Tribology (Wiley, New York, 2002).
3. B. Bhushan, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1627336 21, 2262 (2003).
4. B. Bhushan, Nanotribology and Nanomechanics-An Introduction (Springer, Heidelberg, Germany, 2005).
5. B. Bhushan, J. N. Israelachvili, and U. Landman, Nature (London) 0028-0836 10.1038/374607a0 374, 607 (1995).
6. B. Bhushan, Tribology and Mechanics of Magnetic Storage Systems, 2nd ed. (Springer, New York, 1996).
7. B. Bhushan, Tribology Issues and Opportunities in MEMS (Kluwer Academic, Dordrecht, The Netherlands, 1998).
8. B. Bhushan, Springer Handbook of Nanotechnology, 2nd ed. (Springer, Heidelberg, Germany, 2007).
9. A. V. Adamson, Physical Chemistry of Surfaces (Wiley, New York, 1990).
10. J. N. Israelachvili, Intermolecular and Surface Forces, 2nd ed. (Academic, London, 1992).
11. B. Bhushan and Y. C. Jung, J. Phys.: Condens. Matter (in press). 0953-8984
12. M. Nosonovsky and B. Bhushan, Mater. Sci. Eng., R. 0927-796X 10.1016/j.mser.2007.09.001 58, 162 (2007).
13. M. Nosonovsky and B. Bhushan, J. Phys.: Condens. Matter (in press). 0953-8984
14. T. Pompe and S. Herminghaus, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.1930 85, 1930 (2000).
15. A. Checco, P. Guenoun, and J. Daillant, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.91.186101 91, 186101 (2003).
16. M. Hong, K. H. Kim, J. Bae, and W. Jhe, Appl. Phys. Lett. 0003-6951 10.1063/1.1319181 77, 2604 (2000).
17. Y. Tan, V. Cristini, and A. P. Lee, Sens. Actuators B 114, 350 (2006).
18. A. Meister, S. Jeney, M. Liley, T. Akiyama, U. Staufer, N. F. de Rooij, and H. Heinzelmann, Microelectron. Eng. 67-68, 644 (2003).
19. A. Meister, M. Liley, J. Brugger, R. Pugin, and H. Heinzelmann, Appl. Phys. Lett. 0003-6951 10.1063/1.1842352 85, 6260 (2004).
20. A. Fang, E. Dujardin, and T. Ondarcuhu, Nano Lett. 6, 2368 (2006). 1530-6984
21. K. W. Stockelhuber, B. Radoev, and H. J. Schulze, Colloids Surf., A 0927-7757 10.1016/S0927-7757(99)00084-9 156, 323 (1999).
22. J. P. S. Farinha and M. A. Winnik, Langmuir 16, 3391 (2000). 0743-7463
23. M. Sundberg, A. Mansson, and S. Tagerud, J. Colloid Interface Sci. 313, 454 (2007). 0021-9797
24. D. R. Lide, Handbook of Chemistry and Physics, 88th ed. (CRC Press, Boca Raton, FL, 2008).
25. L. Barbieri, E. Wagner, and P. Hoffmann, Langmuir 23, 1723 (2007). 0743-7463
26. B. Bhushan and M. Cichomski, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.2426979 25, 1285 (2007).
27. J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 0034-6748 10.1063/1.1144209 64, 403 (1993).
28. B. Bhushan and G. S. Blackman, ASME J. Tribol. 113, 452 (1991).
29. N. Chen and B. Bhushan, J. Microsc. 0022-2720 10.1111/j.1365-2818.2006. 01553.x 221, 203 (2006).
30. R. A. Lodge and B. Bhushan, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.2180275 24, 1258 (2006).
31. A. Meister, S. Krishnamoorthy, C. Hinderling, R. Pugin, and H. Heinzelmann, Microelectron. Eng. 83, 1509 (2006).
32. D. Quere, Nat. Mater. 1476-1122 10.1038/nmat1062 3, 79 (2004).
33. M. Nosonovsky and B. Bhushan, Ultramicroscopy 107, 969 (2007). 0304-3991