Scanning nanolithography using a material-filled nanopipette

Applied Physics Letters

Volumn 77, Issue 16, 2000, Pages 2604-2606

  Hong, Mun Heon ^b   Kim, Ki Hyun ^a,b   Bae, Joonho ^b   Jhe, Wonho ^b  

^a SAMSUNG Electronics   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041641563     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1319181     Document Type: Article

References (13)

1. See, for example, Scanning Probe Microscopy, edited by R. Wiesendanger (Springer, Berlin, 1998).
2. K. H. Kim, M. H. Hong, J. Bae, and W. Jhe, Technical Digest of the 5th International Conference on Near-Field Optics (NFO-5) (Shirahama, 1998), p. 373. Patent pending (1999).
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13. A. Lewis, Y. Kheifetz, E. Shambrodt, A. Radko, and E. Khatchatryan, Appl. Phys. Lett. 75, 2689 (1999).