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Volumn 20, Issue 2, 2008, Pages 87-102

Effect of thermal and deposition processes on surface morphology, crystallinity, and adhesion of Parylene-C

Author keywords

Adhesion; Crystallinity; CVD thin film; Parylene C; Surface morphology

Indexed keywords


EID: 46049095897     PISSN: 09144935     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (52)

References (32)
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    • M. Topper, M. Klein, K. Buschick, V. Glaw, K. Orth, O. Ehrmann, M. Hutter, H. Oppermann, K.-F. Becker, T. Braun, F. Ebling, H. Reichl, S. Kim, P. Tathireddy, S. Chakravarty and F. Solzbacher: Presented at the 55th Electronic Components and Technology Conference (ECTC) (San Diego, 2006).
    • M. Topper, M. Klein, K. Buschick, V. Glaw, K. Orth, O. Ehrmann, M. Hutter, H. Oppermann, K.-F. Becker, T. Braun, F. Ebling, H. Reichl, S. Kim, P. Tathireddy, S. Chakravarty and F. Solzbacher: Presented at the 55th Electronic Components and Technology Conference (ECTC) (San Diego, 2006).
  • 10
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    • J.-M. Hsu, S. Kammer, E. Jung, L. Rieth, R. A. Normann and F. Solzbacher: Presented at the 4M2007 Conference on Multi-Material Micro Manufacture (Borovets, 2007).
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  • 23
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    • (1971)
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    • S. Kammer, M. Grosse Holthaus, J.-M. Hsu, K. P. Koch and F. Solzbacher: Presented at the 1st Electronics System Integration Technology Conference (Dresden, 2006).
    • S. Kammer, M. Grosse Holthaus, J.-M. Hsu, K. P. Koch and F. Solzbacher: Presented at the 1st Electronics System Integration Technology Conference (Dresden, 2006).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.