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Volumn 57, Issue 15, 1998, Pages 8801-8804

First-principles study of the stability of the interface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005229906     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.8801     Document Type: Article
Times cited : (9)

References (17)
  • 14
    • 84914746316 scopus 로고
    • J. M. Gibson, R. T. Tung, and J. M. Poate, in Defects in Semiconductors II, edited by S. Mohajan and J. W. Corbett, MRS Symposia Proceedings No. 14 (Materials Research Society, Pittsburgh, 1983), p. 395.
    • (1983) Defects in Semiconductors II , pp. 395
    • Gibson, J.1    Tung, R.2    Poate, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.