Volume change during the formation of nanoporous gold by dealloying

Physical Review Letters

Volumn 97, Issue 3, 2006, Pages

  Parida, S ^a   Kramer, D ^a   Volkert, C A ^a   Rosner H ^a   Erlebacher, J ^b   Weissmuller J ^a,c  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; FORMING; GOLD ALLOYS; POROUS MATERIALS; SHRINKAGE; SILVER;

ELECTROCHEMICAL DEALLOYING; MACROSCOPIC SHRINKAGE; VOLUME CHANGE;

NANOSTRUCTURED MATERIALS;

EID: 33746465841     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.035504     Document Type: Article

References (24)

1. G. Tammann, Z. Anorg. Allg. Chem. ZAACAB 0044-2313 107, 1 (1919). 10.1002/zaac.19191070102
2. R.C. Newman, S.G. Corcoran, J. Erlebacher, M.J. Aziz, and K. Sieradzki, MRS Bull. MRSBEA 0883-7694 24, 24 (1999).
3. M. Raney, Ind. Eng. Chem. 32, 1199 (1940). IECHAD 0019-7866 10.1021/ie50369a030
4. R.W. Ertenberg, B. Andraka, and Y. Takano, Physica (Amsterdam) PHYBE3 0921-4526 284B-288B, 2022 (2000). 10.1016/S0921-4526(99)02812-4
5. Y. Ding, M.W. Chen, and J. Erlebacher, J. Am. Chem. Soc. 126, 6876 (2004). JACSAT 0002-7863 10.1021/ja0320119
6. D. Kramer, R.N. Viswanath, and J. Weissmüller, Nano Lett. NALEFD 1530-6984 4, 793 (2004). 10.1021/nl049927d
7. A.M. Hodge, J. Biener, L.L. Hsiung, Y.M. Wang, A.V. Hamza, and J.H. Satcher, Jr., J. Mater. Res. 20, 554 (2005). JMREEE 0884-2914 10.1557/JMR.2005.0081
8. A.J. Forty and P. Durkin, Philos. Mag. A PMAADG 0141-8610 42, 295 (1980).
9. J. Erlebacher, M.J. Aziz, A. Karma, N. Dimitrov, and K. Sieradzki, Nature (London) 410, 450 (2001). NATUAS 0028-0836 10.1038/35068529
10. J. Erlebacher, J. Electrochem. Soc. 151, C614 (2004). JESOAN 0013-4651 10.1149/1.1784820
11. Y. Ding, Y.-J. Kim, and J. Erlebacher, Adv. Mater. 16, 1897 (2004). ADVMEW 0935-9648 10.1002/adma.200400792
12. R.N. Viswanath, D. Kramer, and J. Weissmüller, Langmuir 21, 4604 (2005). LANGD5 0743-7463 10.1021/la0473759
13. J. Biener, A.M. Hodge, and A.V. Hamza, Appl. Phys. Lett. 87, 121908 (2005). APPLAB 0003-6951 10.1063/1.2051791
14. B.G. Ateya, G. Geh, A.H. Carim, and H.W. Pickering, J. Electrochem. Soc. 149, B27 (2002). JESOAN 0013-4651 10.1149/1.1430414
15. J. Weissmüller and J.W. Cahn, Acta Mater. 45, 1899 (1997). ACMAFD 1359-6454 10.1016/S1359-6454(96)00314-X
16. J. Diao, K. Gall, and M.L. Dunn, Phys. Rev. B PRBMDO 0163-1829 70, 075413 (2004). 10.1103/PhysRevB.70.075413
17. J. Weissmüller and J. Markmann, Adv. Eng. Mater. 7, 202 (2005). AENMFY 1438-1656 10.1002/adem.200400211
18. M.R. Sørensen, M. Brandbyge, and K.W. Jacobsen, Phys. Rev. B PRBMDO 0163-1829 57, 3283 (1998). 10.1103/PhysRevB.57.3283
19. H.W. Pickering and C. Wagner, J. Electrochem. Soc. 114, 698 (1967). JESOAN 0013-4651
20. A.V. Vvedenskii and I.K. Marshakov, Russ. J. Electrochem. RJELE3 1023-1935 31, 234 (1995).
21. J.-Y. Zou, D.-H. Wang, and W.-C. Qiu, Electrochim. Acta 42, 1733 (1997). ELCAAV 0013-4686 10.1016/S0013-4686(96)00373-8
22. Yu.Ya. Andreev and A.V. Goncharov, Electrochim. Acta 50, 2629 (2005). ELCAAV 0013-4686 10.1016/j.electacta.2004.11.022
23. E. Schofield, Trans. Inst. Met. Finish. TIMFA2 0020-2967 83, 35 (2005). 10.1179/002029605X17701
24. T.L. Davis, J. Appl. Phys. 38, 3756 (1967). JAPIAU 0021-8979 10.1063/1.1710206