Structural analysis of annealed amorphous SiO/SiO2 superlattice

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 6796-6799

  Pivac, B ^a   Dubcek P ^a   Capan, I ^a   Zorc, H ^a   Bernstorff, S ^b   Duguay, S ^c   Slaoui, A ^c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b SINCROTRONE TRIESTE   (Italy)

^c Faculté de Médecine   (France)

Author keywords

Si nanostructures; SiO SiO2 amorphous superlattice; Small angle X ray scattering

Indexed keywords

STRUCTURAL ANALYSIS;

EID: 45849134886     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.005     Document Type: Article

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