Magnetic near-field measurements over LSI package pins by fiber-edge magnetooptic probe

Journal of Lightwave Technology

Volumn 21, Issue 12, 2003, Pages 3273-3281

  Iwanami, Mizuki ^a   Yamazaki, Etsushi ^b   Nakano, Ken ^a   Sudo, Toshio ^a   Hoshino, Shigeki ^a   Wakana, Shinichi ^c   Kishi, Masato ^d   Tsuchiya, Masahiro ^e  

^a ASSOCIATION OF SUPER ADVANCED ELECTRONICS TECHNOLOGIES ASET   (Japan)

^b NTT Corporation   (Japan)

^c FUJITSU LABORATORIES LTD   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE INTERFERENCE; LSI CIRCUITS; MAGNETIC FIELD MEASUREMENT; MAGNETOOPTICAL DEVICES; PRINTED CIRCUIT BOARDS; PROBES;

FIBER EDGE MAGNETOOPTIC PROBING TECHNIQUE; MAGNETIC NEAR FIELD DISTRIBUTION; RADIATED ELECTRIC FIELD STRENGTH;

FIBER OPTICS;

EID: 4544291541     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2003.820047     Document Type: Article

References (18)

1. K. Yang, G. David, S. V. Robertson, J. F. Whitaker, and L. P. B. Katehi, "Electrooptic mapping of near-field distributions in integrated microwave circuits," IEEE Trans. Microwave Theory Tech., vol. 46, pp. 2338-2343, Dec. 1998.
2. S. Wakana, T. Ohara, M. Abe, E. Yamazaki, M. Kishi, and M. Tsuchiya, "Fiber-edge electrooptic/magnetooptic probe for spectral-domain analysis of electromagnetic field," IEEE Trans. Microwave Theory Tech., vol. 48, pp. 2611-2616, Dec. 2000.
3. E. Yamazaki, H. Park, S. Wakana, M. Kishi, and M. Tsuchiya, "Implementation of magneto-optic probe with > 10 Ghz bandwidth," Jpn. J. Appl. Phys., vol. 41, no. 7B, pp. L864-L866, July 2002.
4. K. P. Slattery, J. W. Neal, and W. Cui, "Near-field measurements of VLSI devices," IEEE Trans. Electromagn. Compat., vol. 41, no. 4, pp. 374-384, Nov. 1999.
5. Y. Fukumoto, O. Shibata, K. Takayama, T. Kinoshita, Z. L. Wang, Y. Toyota, O. Wada, and R. Koga, "Radiated emission analysis of power bus noise by using a power current model of an LSI," in Proc. 2002 IEEE Int. Symp. Electromagnetic Compatibility, Aug. 2002, pp. 1037-1042.
6. A. R. Djordjevic and T. K. Sarkar, "An investigation of delta-I noise on integrated circuits," IEEE Trans. Electromagn. Compat., vol. 35, pp. 134-147, May 1993.
7. Y. Gao and I. Wolff, "A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits," IEEE Trans. Microwave Theory Tech., vol. 44, pp. 911-918, June 1996.
8. Y. Gao, "Miniature electric near-field probes for measuring 3-D fields in planar microwave circuits," IEEE Trans. Microwave Theory Tech., vol. 46, pp. 907-913, July 1998.
9. N. Masuda, N. Tamaki, H. Wabuka, T. Watanabe, and K. Ishizaka, "A multilayer board-type magnetic field loop probe with high spatial resolution and RF current estimation method for ICs," in Proc. EMC '99 Int. Symp., vol. S14, Tokyo, May 1999, p. 801.
10. E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, and C.-H. Chang, "Near-field magneto-optics and high density data storage," Appl. Phys. Lett., vol. 61, no. 2, pp. 142-144, July 1992.
11. T. J. Silva, S. Schultz, and D. Weller, "Scanning near-field optical microscope for the imaging of magnetic domains in optically opaque materials," Appl. Phys. Lett., vol. 65, no. 6, pp. 658-660, Aug. 1994.
12. E. Yamazaki, S. Wakana, M. Kishi, M. Iwanami, S. Hoshino, and M. Tsuchiya, "Three-dimensional magneto-optic near-field mapping over 10-50 mm-scale line and space circuit patterns," in Proc. 14th Annu. Meeting IEEE Lasers Electro-Optics Society, Nov. 2001, p. 318.
13. T. Sudo, K. Nakano, A. Nakamura, and S. Haga, "A test chip for evaluating switching noise and radiated emission by I/O and core circuits," in Proc. 2001 IEEE Int. Symp. Electromagnetic Compatibility, Aug. 2001, pp. 676-680.
14. E. Yamazaki, S. Wakana, M. Kishi, M. Tsuchiya, M. Iwanami; and S. Hoshino, "Spatial resolution evaluation of fiber edge magneto-optic probe," in Proc. 2001 IEICE General Conf., vol. B-4-20, Mar. 2001, p. 335.
15. H. Johnson and M. Graham, High-Speed Digital Design: A Handbook of Black Magic. Englewood Cliffs, NJ: Prentice-Hall, 1993, pp. 66-74.
16. T. Harada, H. Sasaki, and Y. Kami, "Investigation on radiated emission characteristics of multilayer printed circuit boards," IEICE Trans. Commun., vol. E80-B, no. 11, pp. 1645-1651, Nov. 1997.
17. H. Sasaki, T. Harada, and T. Kuriyama, "A new VLSI decoupling circuit for suppressing radiated emissions from multilayer printed circuit boards," in Proc. 2000 IEEE Int. Symp. Electromagnetic Compatibility, Aug. 2000, pp. 157-162.
18. J. P. Libous and D. P. O'Connor, "Measurement, modeling, and simulation of flip-chip CMOS ASIC simultaneous switching noise on a multilayer ceramic BGA," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 20, pp. 266-271, Aug. 1997.