Radiated emission analysis of power bus noise by using a power current model of an LSI

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2002, Pages 1037-1042

  Fukumoto, Yukihiro ^a   Shibata, Osamu ^a   Takayama, Keisuke ^b   Kinoshita, Tomohiro ^b   Wang, Zhi Liang ^b   Toyota, Yoshitake ^b   Wada, Osami ^b   Koga, Ryuji ^b  

^a PANASONIC CORPORATION   (Japan)

^b OKAYAMA UNIVERSITY   (Japan)

Author keywords

EMI; LSI; Power current model; Printed circuit board; Simulation

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POWER SYSTEMS; ELECTROMAGNETIC WAVE EMISSION; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; FREQUENCY DOMAIN ANALYSIS; LSI CIRCUITS;

POWER BUS NOISES;

SPURIOUS SIGNAL NOISE;

EID: 0036383561     PISSN: 01901494     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISEMC.2002.1032839     Document Type: Article

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