Random telegraph signals in charge coupled devices

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 530, Issue 3, 2004, Pages 521-535

  Smith, D R ^a   Holland, A D ^a   Hutchinson, I B ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

CCD; Charge coupled device; Radiation damage; Random telegraph signal

Indexed keywords

CYCLOTRONS; DATA ACQUISITION; MATHEMATICAL MODELS; MOS DEVICES; PHOTODIODES; PROTON IRRADIATION; SIGNAL PROCESSING; TELEGRAPH; TRANSISTORS;

HOLE EMISSIONS; RADIATION DAMAGES; RANDOM TELEGRAPH SIGNALS (RTS); X-RAY APPLICATIONS;

CHARGE COUPLED DEVICES;

EID: 4544283300     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.03.210     Document Type: Article

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