Proton induced leakage current in CCDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 2, 2002, Pages 842-848

  Smith, David R ^a   Holland, Andrew D ^a   Robbins, Mark S ^b   Ambrosi, Richard M ^a   Hutchinson, Ian B ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b E2V TECHNOLOGIES   (United Kingdom)

Author keywords

Bright pixel; CCD; Damage; Leakage current; Proton; Random telegraph signal

Indexed keywords

FREQUENCIES; IONIZATION; IRRADIATION; LEAKAGE CURRENTS; PROTONS; SIGNAL GENERATORS; TELEGRAPH;

RANDOM TELEGRAPH SIGNALS (RTS);

CHARGE COUPLED DEVICES;

EID: 0037957273     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461331     Document Type: Conference Paper

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